Selected ion monitoring
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Jump to navigationJump to searchSelected ion monitoring (SIM) is a mass spectrometry scanning mode in which only a limited mass-to-charge ratio range is transmitted/detected by the instrument, as opposed to the full spectrum range.[1][2][3][4] This mode of operation typically results in significantly increased sensitivity. Due to their inherent nature, this technique is most effective—and therefore most common—on quadrupole mass spectrometers, Orbitrap, and Fourier transform ion cyclotron resonance mass spectrometers.
See also
References
- ^ IUPAC, Compendium of Chemical Terminology, 2nd ed. (the "Gold Book") (1997). Online corrected version: (2006–) "selected ion monitoring". doi:10.1351/goldbook.S05547
- ^ Murray, Kermit K.; Boyd, Robert K.; Eberlin, Marcos N.; Langley, G. John; Li, Liang; Naito, Yasuhide (2013). "Definitions of terms relating to mass spectrometry (IUPAC Recommendations 2013)". Pure and Applied Chemistry. 85 (7): 1515–1609. doi:10.1351/PAC-REC-06-04-06. ISSN 0033-4545.
- ^ Kaufmann, Anton (2018). "Analytical performance of the various acquisition modes in Orbitrap MS and MS/MS". Journal of Mass Spectrometry. 53 (8): 725–738. doi:10.1002/jms.4195. ISSN 1076-5174.
- ^ Lu, Wenyun; McBride, Matthew J.; Lee, Won Dong; Xing, Xi; Xu, Xincheng; Li, Xi; Oschmann, Anna M.; Shen, Yihui; Bartman, Caroline; Rabinowitz, Joshua D. (2024). "Selected Ion Monitoring for Orbitrap-Based Metabolomics". Metabolites. 14 (4): 184. doi:10.3390/metabo14040184. ISSN 2218-1989.
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Notes
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